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Title: | Efficiently Generating Test Data to Kill Stubborn Mutants by Dynamically Reducing the Search Domain |
Authors: | Dang, Xiangying |
Participants: | Yao, Xiangjuan Gong, Dunwei Tian, Tian |
Issue Date: | 2020 |
Publisher: | IEEE Xplore |
Series/Report no.: | IEEE Transactions on Reliability ( Volume: 69, Issue: 1, March 2020) |
Abstract: | Mutation testing is a fault-oriented software testing technique, and a test suite generated based on the criterion of mutation testing generally has a high capability in detecting faults. A mutant that is hard killed is called a stubborn one. The traditional methods of test data generation often fail to generate test data that kill stubborn mutants. To improve the efficiency of killing stubborn mutants, in this article, we propose a method of generating test data by dynamically reducing the search domain under the criterion of strong mutation testing. To fulfill this task, we first present a method of measuring the stubbornness of a mutant based on the reachability condition of a mutated statement. Then, we formulate the problem of generating test data to kill the mutant as an optimization one with a unique constraint. Finally, we generate test data using a coevolutionary genetic algorithm. Given the fact that the domain of test data that kills a stubborn mutant is generally small, we adopt a method of dynamically reducing the search domain to improve the efficiency of the algorithm. We apply the proposed method to test eight benchmark and industrial programs. The experimental results demonstrate that the proposed method has capabilities in seeking stubborn mutants and efficiently generating test data to kill stubborn mutants |
URI: | http://tailieuso.tlu.edu.vn/handle/DHTL/10470 |
Source: | https://doi.org/10.1109/TR.2019.2922684 |
Appears in Collections: | Tài liệu hỗ trợ nghiên cứu khoa học |
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